Digital System Design-Test-Verification and Fault Tolerance Research Group

Research Interests

• Reliable and safety-critical digital systems.


• Scalable verification for modern processors and SoC designs.


• Dependable computing platforms for academic and industrial use.

Research Activities

The Digital System Design, Test, Verification, and Fault Tolerance Research Group researches the lifetime validation of digital systems, addressing reliability and correctness from design through deployment. Our work incorporates fabrication fault testing, simulation-based verification, and run-time validation techniques to account for design errors, manufacturing defects, and operational faults.

Current research efforts include:

• Gate-level and high-level simulation-based techniques for efficient design verification.


• Post-silicon verification methods that enhance observability of internal signals in complex digital systems.


• Online and run-time testing techniques for detecting operational faults during normal system operation.


• Approximate and exact global fault-collapsing methods to reduce verification and test complexity.


• Implementation-independent functional test generation methods for high-quality functional test vectors.

Applications and Impact

• Reliable and safety-critical digital systems.


• Scalable verification for modern processors and SoC designs.


• Dependable computing platforms for academic and industrial use.