Organizing Committee Member: International High Level Design Validation and Test Workshop (2008), International Conference on Computer Design—ICCD (2009).

Program Committee Member: International Conference on Circuits, Signals, and Systems (2005, 2006, 2007, 2010), International Conference on Computer Design—CDES (2005, 2006, 2007, 2008, 2010), International High Level Design Validation and Test Workshop (2004, 2005, 2006, 2007), International Conference on VLSI (2003, 2004), Microprocessor Test and Verification Workshop (1999, 2004, 2005, 2006, 2007, 2008, 2009, 2010), International Conference on Parallel and Distrib­uted Processing Techniques and Applications (2007, 2010).

Technical paper referee: International Conference on Circuits, Signals, and Systems (2005, 2006, 2007, 2010), International High Level Design Validation and Test Workshop (2004, 2005, 2006), International On-Line Testing Symposium (2003), Defect and Fault Tolerance Symposium (2002), International Test Conference (1996, 1998, 2000-2010, VLSI Test Symposium (1996-1998, 2000, 2005), Design Automation Conference (1998-1999, 2001-2003), IEEE Transactions on Circuits & Systems-II (2000), Journal of Electronic Testing (1996, 2001, 2004, 2005, 2009), Journal of Super­computing (2004, 2005), IEEE Transactions on Computers (1997, 2005, 2006, 2007, 2008), IEEE Transactions on CAD (2000, 2002, 2006), IEEE Transactions on VLSI (2000, 2005, 2007, 2010), ACM Transactions on Design Automation of Electronic Systems (2007), Microelectronics Journal (2008).

Technical Panel Member: System Level Design Panel for the Information Sciences & Engineering directorate of the National Science Foundation (2004), Test Panel for the Design Automation Pro­gram of the National Science Foundation (2001).

Technical Proposal Reviewer: Natural Sciences and Engineering Research Council of Canada (2003), Design Automation Program of the National Science Foundation (2002), University of Cali­fornia MICRO Program (2000), U.S. Civilian Research & Development Foundation—Cooperative Grants Program (2006), France-Berkeley Fund (2006).

Technical Book Reviewer: IEEE Press (2002), Thomson Nelson – Higher Education (2004), Morgan Kaufmann Publishers (2005-2006), John Wiley & Sons, Inc. (2005).

Technical Session Chair: VLSI Test Symposium (2005), International Conference on Computer Design—ICCD (2005), International Conference on Computer Design—CDES (2005, 2006, 2007, 2009, 2010), International Test Conference (2003, 2006), International Conference on VLSI (2002-2004), International Test Synthesis Workshop (2004), International Conference on Circuits, Signals, and Systems (2005, 2006), Microprocessor Test and Verification Workshop (2005), International High Level Design Validation and Test Workshop (2006).