3 units – Winter Quarter; alternate years
Lecture: 3 hours
Prerequisite: EEC 180A, STA 120 or STA 131A
Grading: Letter; homework (30%), midterm exam (30%) and final (40%).
A review of several current techniques used to diagnose faults in both combinational and sequential circuits. Topics include path sensitization procedures, Boolean difference, D-algorithm random test generation, TC testing and an analysis of the effects of intermittent faults. (Offered in even years.)
Expanded Course Description:
THIS COURSE DOES NOT DUPLICATE ANY EXISTING COURSE.
Last revised: October 1996